Facilities

Facilities

Electron Microscope

Aberration Corrected Analytical Scanning Transmission Electron Microscope (S/TEM)

  • Microscope: Thermo Fisher Themis Z
  • Acceleration voltage: 60-300 keV (with monochromator)
  • Electron source: High Brightness Schottky Field Emission Gun (X-FEG)
  • Aberration corrector: Cs S-CORR Probe Corrector with higher order aberration correction (C5 and A5)
  • EDS option: Super-X EDS detector
  • EELS option: Gatan Continuum ER/1065
  • Detectors: Ceta 16M with speed enhancement and EMPAD
  • Additional capability: Tomography, Precession electron diffraction, Cryo holder, ProtochipsĀ in-situ biasing + heating holder

Sample Preparation

FEI Helios Nanolab 600i Dual Beam FIB/SEM

  • Elstar SEM column: 0.3 – 30 kV with < 1 nm resolution
  • Sidewinder FIB column: 2 – 30 kV, 1 pA – 65 nA
  • In-situ Pt deposition GIS
  • Omniprobe AutoProbe 200 in-situ micromanipulator
  • EDAX TEAM EDS and EBSD acquisition

FEI Helios G4 PFIB CXE Dual Beam FIB/SEM

  • Elstar UC+ SEM column: 0.3 – 30 kV with < 1 nm resolution
  • Plasma FIB 2.0 column: 2 – 30 kV, 1 pA – 2.5 ĀµA
  • In-situ Pt and C deposition GIS
  • EasyLift in-situ micromanipulator
  • EDAX TEAM and APEX EDS and EBSD acquisition